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Ion Beam Deposition and Surface Characterization of Thin Multicomponent Oxide Films During Growth (A. Krauss, et al.). Reflection High-Energy Electron Diffraction as a Tool for Real-Time Characterization of Growth of Complex Oxides (I. Bozovic, et al.). In Situ Real-Time Characterization of Surfaces and Film Growth Processes via Ellipsometry (E. Irene). Evaluation of Initial Stages of Heteroepitaxial Growth by Reflectance Spectroscopy and Transmission Electron Microscopy (K. Bachmann & S. Mahajan). Laser Reflection Interferometry for In Situ Real-Time Characterization of Film Growth Rate, Surface Roughness, and Optical Absorption. (T. McCauley, et al.). X-Ray Reflectivity for Studies of Surface and Interface Structure (E. Chason). Curvature-Based Techniques for Real-Time Stress Measurements During Thin-Film Growth (J. Floro & E. Chason). Photoelectron Emission Microscopy and Related Techniques for In Situ Real-Time Surface Studies (M. Kordesch). Index.