Table of contents for In situ real time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.


Bibliographic record and links to related information available from the Library of Congress catalog


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Ion Beam Deposition and Surface Characterization of Thin Multicomponent Oxide Films During Growth (A. Krauss, et al.).
Reflection High-Energy Electron Diffraction as a Tool for Real-Time Characterization of Growth of Complex Oxides (I. Bozovic, et al.).
In Situ Real-Time Characterization of Surfaces and Film Growth Processes via Ellipsometry (E. Irene).
Evaluation of Initial Stages of Heteroepitaxial Growth by Reflectance Spectroscopy and Transmission Electron Microscopy (K. Bachmann & S. Mahajan).
Laser Reflection Interferometry for In Situ Real-Time Characterization of Film Growth Rate, Surface Roughness, and Optical Absorption. (T. McCauley, et al.).
X-Ray Reflectivity for Studies of Surface and Interface Structure (E. Chason).
Curvature-Based Techniques for Real-Time Stress Measurements During Thin-Film Growth (J. Floro & E. Chason).
Photoelectron Emission Microscopy and Related Techniques for In Situ Real-Time Surface Studies (M. Kordesch).
Index.


Library of Congress subject headings for this publication: Thin films