Publisher description for Handbook of charged particle optics / edited by Jon Orloff.
Bibliographic record and links to related information available from the Library of Congress catalog
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Balancing its coverage of theory with a wide range of application areas, Handbook of Charged Particle Optics provides a complete guide to understanding, designing, and using high resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources. Including additional references to past and present work in the field, this comprehensive text also presents up-to-date information of Schottky electron as well as liquid metal ion sources.
Library of Congress subject headings for this publication:
Optical instruments -- Design and construction -- Handbooks, manuals, etc.
Electron optics -- Handbooks, manuals, etc.