Table of contents for A unified approach for timing verification and delay fault testing / Mukund Sivaraman and Andrzej J. Strojwas.

Bibliographic record and links to related information available from the Library of Congress catalog

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List of Figures. List of Tables. Preface. 1. Introduction. 2. Background. 3. Primitive Path Delay Fault Identification. 4. Timing Analysis. 5. Delay Fault Diagnosis. 6. Delay Fault Coverage. 7. Epilogue. References. Index.

Library of Congress subject headings for this publication:
Digital integrated circuits -- Design and construction -- Data processing.
Digital integrated circuits -- Testing.
Delay faults (Semiconductors)
Integrated circuits -- Verification.