Table of contents for Semiconductor material and device characterization / Dieter K. Schroder.
Bibliographic record and links to related information available from the Library of Congress catalog
Information from electronic data provided by the publisher. May be incomplete or contain other coding.
Carrier and Doping Density.
Contact Resistance, Schottky Barriers, and Electromigration.
Series Resistance, Channel Length and Width, Threshold Voltage, and Hot Carriers.
Oxide and Interface Trapped Charges, Oxide Integrity.
Chemical and Physical Characterization.
Library of Congress subject headings for this publication:
Semiconductors -- Testing.