Table of contents for Semiconductor material and device characterization / Dieter K. Schroder.


Bibliographic record and links to related information available from the Library of Congress catalog


Information from electronic data provided by the publisher. May be incomplete or contain other coding.


Counter
Resistivity.
Carrier and Doping Density.
Contact Resistance, Schottky Barriers, and Electromigration.
Series Resistance, Channel Length and Width, Threshold Voltage, and Hot Carriers.
Defects.
Oxide and Interface Trapped Charges, Oxide Integrity.
Carrier Lifetime.
Mobility.
Optical Characterization.
Chemical and Physical Characterization.
Appendices.
Index.


Library of Congress subject headings for this publication:
Semiconductors.
Semiconductors -- Testing.