Table of contents for An introduction to mixed-signal IC test and measurement / Mark Burns, Gordon W. Roberts.


Bibliographic record and links to related information available from the Library of Congress catalog


Information from electronic data provided by the publisher. May be incomplete or contain other coding.


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Chapter 1: Overview of Mixed-Signal Testing
1.1. Mixed-Signal Ciruits
1.2. Why Test Mixed-Signal Devices
1.3. Post-Silicon Production Flow
1.4. Test and Diagnostic Equipment
1.5. New Product Development
1.6. Mixed-Signal Testing Challenges
Chapter 2: The Test Specification Process
2.1. Device Data Sheets
2.2. Generating the Test Plan
2.3. Components of a Test Program
2.4. Summary
Chapter 3: DC and Parametric Measurements
3.1. Continuity
3.2. Leakage Currents
3.3. Power Supply Currents
3.4. DC References and Regulators
3.5. Impedance Measurements
3.6. DC Offset Measurements
3.7. DC Gain Measurements
3.8. DC Power Supply Rejection Ratio
3.9. DC Common Mode Rejection Ratio
3.10. Comparator DC Tests
3.11. Voltage Search Techniques
3.12. DC Tests for Digital Circuits
3.13. Summary
Chapter 4: Measurement Accuracy
4.1. Terminology
4.2. Calibrations and Checkers
4.3. Dealing with Measurement Error
4.4. Basic Data Analysis
4.5. Summary
Chapter 5: Tester Hardware
5.1. Mixed-Signal Tester Overview
5.2. DC Resources
5.3. Digital Subsystem
5.4. AC Source and Measurement
5.5. Time Measurement System
5.6. Computing Hardware
5.7. Summary
Chapter 6: Sampling Theory
6.1. Analog Measurements Using DSP
6.2. Sampling and Reconstruction
6.3. Repetitive Sample Sets
6.4. Synchronization of Sampling Systems
6.5. Summary
Chapter 7: DSP-Based Testing
7.1. Advantages of DSP-Based Testing
7.2. Digital Signal Processing
7.3. Discrete-Time Transforms
7.4. The Inverse FFT
7.5. Summary
Chapter 8: Analog Channel Testing
8.1. Overview
8.2. Gain and Level Tests
8.3. Phase Tests
8.4. Distortion Tests
8.5. Signal Rejection Tests
8.6. Noise Tests
8.7. Simulation of Analog Channel Tests
8.8. Summary
Chapter 9: Sampled Channel Testing
9.1. Overview
9.2. Sampling Considerations
9.3. Encoding and Decoding
9.4. Sampled Channel Tests
9.5. Summary
Chapter 10: Focused Calibrations
10.1. Overview
10.2. DC Calibrations
10.3. AC Amplitude Calibrations
10.4. Other AC Calibrations
10.5. Error Cancellation Techniques
10.6. Summary
Chapter 11: DAC Testing
11.1. Basics of Converter Testing
11.2. Basic DC Tests
11.3. Transfer Curve Tests
11.4. Dynamic DAC Tests
11.5. DAC Architectures
11.6. Summary
Chapter 12: ADC Testing
12.1. ADC Testing Versus DAC Testing
12.2. ADC Code Edge Measurements
12.3. DC Tests and Transfer Curve Tests
12.4. Dynamic ADC Tests
12.5. ADC Architectures
12.6. Tests for Common ADC Applications
12.7. Summary
Chapter 13: DIB Design
13.1. DIB Basics
13.2. Printed Circuit Boards (PCBS)
13.3. DIB Traces, Shields, and Guards
13.4. Transmission Lines
13.5. Grounding and Power Distribution
13.6. DIB Components
13.7. Common DIB Circuits
13.8. Common DIB Mistakes
13.9. Summary
Chapter 14: Design for Test (DfT)
14.1. Overview
14.2. Advantages of DfT
14.3. Digital Scan
14.4. Digital BIST
14.5. Digital DfT for Mixed-Signal Circuits
14.6. Mixed-Signal Boundary Scan and BIST
14.7. Ad Hoc Mixed-Signal DfT
14.8. Subtle Forms of Analog DFT
14.9. IDDQ
14.10. Summary
Chapter 15: Data Analysis
15.1. Introduction to Data Analysis
15.2. Data Visualization Tools
15.3. Statistical Analysis
15.4. Statistical Process Control (SPC)
15.5. Summary
Chapter 16: Test Economics
16.1. Profitability Factors
16.2. Direct Testing Costs
16.3. Debugging Skills
16.4. Emerging Trends
16.5. Summary



Library of Congress subject headings for this publication:
Integrated circuits -- Testing.
Mixed signal circuits -- Testing.