Publisher-supplied biographical information about contributor(s) for A practical guide for the preparation of specimens for x-ray fluorescence and x-ray diffraction analysis / edited by Victor E. Buhrke, Ron Jenkins, Deane K. Smith.

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VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California.

RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.

DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.

Library of Congress subject headings for this publication: X-ray spectroscopy, X-ray crystallography, Sampling Technique